N-Methyl-2-pyrrolidon (NMP), ALEG® für Mikroelektronik, J.T.Baker®

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6397-05EA 163 EUR
6397-05
N-Methyl-2-pyrrolidon (NMP), ALEG® für Mikroelektronik, J.T.Baker®
N-Methyl-2-pyrrolidon (NMP)
Formel: C₅H₉NO
Molecular Weight: 99,13 g/mol
Siedepunkt: 202 °C (1013 hPa)
Schmelzpunkt: –24 °C
Dichte: 1,033 g/cm³ (20 °C)
Flammpunkt: 91 °C
Lagertemperatur: Raumtemperatur
MDL: MFCD00003193
CAS-Nummer: 872-50-4
EINECS: 212-828-1
Merck Index: 13,06140
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Spezifikation Testergebnisse

For Microelectronic Use
Assay (C₅H₉NO) ≥99.5 %
Color (APHA) ≤20
Water (H₂O)(by Karl Fischer titrn) ≤0.05 %
Free Amines (as CH₃NH₂) ≤50 ppm
Chloride (Cl) ≤0.5 ppm
Phosphate (PO₄) ≤1 ppm
Trace Impurities - Aluminum (Al) ≤100.0 ppb
Arsenic and Antimony (as As) ≤100.0 ppb
Trace Impurities - Barium (Ba) ≤100.0 ppb
Trace Impurities - Boron (B) ≤100.0 ppb
Trace Impurities - Calcium (Ca) ≤300 ppb
Trace Impurities - Chromium (Cr) ≤100.0 ppb
Trace Impurities - Cobalt (Co) ≤100.0 ppb
Trace Impurities - Copper (Cu) ≤100.0 ppb
Trace Impurities - Gold (Au) ≤100.0 ppb
Trace Impurities - Iron (Fe) ≤100.0 ppb
Trace Impurities - Lead (Pb) ≤100 ppb
Trace Impurities - Lithium (Li) ≤100.0 ppb
Trace Impurities - Magnesium (Mg) ≤100.0 ppb
Trace Impurities - Manganese (Mn) ≤100.0 ppb
Trace Impurities - Nickel (Ni) ≤100.0 ppb
Trace Impurities - Potassium (K) ≤100 ppb
Trace Impurities - Silver (Ag) ≤100.0 ppb
Trace Impurities - Sodium (Na) ≤300 ppb
Trace Impurities - Strontium (Sr) ≤100.0 ppb
Trace Impurities - Tin (Sn) ≤100 ppb
Trace Impurities - Titanium (Ti) ≤100.0 ppb
Trace Impurities - Vanadium (V) ≤100.0 ppb
Trace Impurities - Zinc (Zn) ≤100.0 ppb
Particle Count - 1.0 µm and greater (Rion KS42AF) ≤10 par/ml

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